Back to Search Start Over

Titanium Nitride Films for Ultrasensitive Microresonator Detectors

Authors :
Leduc, Henry G.
Bumble, Bruce
Day, Peter K.
Turner, Anthony D.
Eom, Byeong Ho
Golwala, Sunil
Moore, David C.
Noroozian, Omid
Zmuidzinas, Jonas
Gao, Jiansong
Mazin, Benjamin A.
McHugh, Sean
Merrill, Andrew
Publication Year :
2010

Abstract

Titanium nitride (TiNx) films are ideal for use in superconducting microresonator detectors because: a) the critical temperature varies with composition (0 < Tc < 5 K); b) the normal-state resistivity is large, \rho_n ~ 100 $\mu$Ohm cm, facilitating efficient photon absorption and providing a large kinetic inductance and detector responsivity; and c) TiN films are very hard and mechanically robust. Resonators using reactively sputtered TiN films show remarkably low loss (Q_i > 10^7) and have noise properties similar to resonators made using other materials, while the quasiparticle lifetimes are reasonably long, 10-200 $\mu$s. TiN microresonators should therefore reach sensitivities well below 10^-19 WHz^(-1/2).<br />Comment: to be published in APL

Details

Database :
arXiv
Publication Type :
Report
Accession number :
edsarx.1003.5584
Document Type :
Working Paper
Full Text :
https://doi.org/10.1063/1.3480420