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Wetting on smooth micropatterned defects

Authors :
Debuisson, Damien
Dufour, Renaud
Senez, Vincent
Arscott, Steve
Source :
Appl. Phys. Lett. 99, 184101 (2011)
Publication Year :
2011

Abstract

We develop a model which predicts the contact angle hysteresis introduced by smooth micropatterned defects. The defects are modeled by a smooth function and the contact angle hysteresis is explained using a tangent line solution. When the liquid micro-meniscus touches both sides of the defect simultaneously, depinning of the contact line occurs. The defects are fabricated using a photoresist and experimental results confirm the model. An important point is that the model is scale-independent, i.e. the contact angle hysteresis is dependent on the aspect ratio of the function, not on its absolute size; this could have implications for natural surface defects.<br />Comment: 4 pages, 4 figues, 1 table

Subjects

Subjects :
Physics - Fluid Dynamics

Details

Database :
arXiv
Journal :
Appl. Phys. Lett. 99, 184101 (2011)
Publication Type :
Report
Accession number :
edsarx.1101.0915
Document Type :
Working Paper
Full Text :
https://doi.org/10.1063/1.3657140