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Wetting on smooth micropatterned defects
- Source :
- Appl. Phys. Lett. 99, 184101 (2011)
- Publication Year :
- 2011
-
Abstract
- We develop a model which predicts the contact angle hysteresis introduced by smooth micropatterned defects. The defects are modeled by a smooth function and the contact angle hysteresis is explained using a tangent line solution. When the liquid micro-meniscus touches both sides of the defect simultaneously, depinning of the contact line occurs. The defects are fabricated using a photoresist and experimental results confirm the model. An important point is that the model is scale-independent, i.e. the contact angle hysteresis is dependent on the aspect ratio of the function, not on its absolute size; this could have implications for natural surface defects.<br />Comment: 4 pages, 4 figues, 1 table
- Subjects :
- Physics - Fluid Dynamics
Subjects
Details
- Database :
- arXiv
- Journal :
- Appl. Phys. Lett. 99, 184101 (2011)
- Publication Type :
- Report
- Accession number :
- edsarx.1101.0915
- Document Type :
- Working Paper
- Full Text :
- https://doi.org/10.1063/1.3657140