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Thickness-dependent ferromagnetic metal to paramagnetic insulator transition in La$_{0.6}$Sr$_{0.4}$MnO$_3$ thin films studied by x-ray magnetic circular dichroism

Authors :
Shibata, Goro
Yoshimatsu, Kohei
Sakai, Enju
Singh, Vijay Raj
Verma, Virendra Kumar
Ishigami, Keisuke
Harano, Takayuki
Kadono, Toshiharu
Takeda, Yukiharu
Okane, Tetsuo
Saitoh, Yuji
Yamagami, Hiroshi
Sawa, Akihito
Kumigashira, Hiroshi
Oshima, Masaharu
Koide, Tsuneharu
Fujimori, Atsushi
Source :
Phys. Rev. B 89, 235123 (2014)
Publication Year :
2013

Abstract

Metallic transition-metal oxides undergo a metal-to-insulator transition (MIT) as the film thickness decreases across a ritical thickness of several monolayers (MLs), but its driving mechanism remains controversial. We have studied the thickness-dependent MIT of the ferromagnetic metal La$_{0.6}$Sr$_{0.4}$MnO$_3$ by x-ray absorption spectroscopy and x-ray magnetic circular dichroism. As the film thickness was decreased across the critical thickness of the MIT (6-8 ML), a gradual decrease of the ferromagnetic signals and a concomitant increase of paramagnetic signals were observed, while the Mn valence abruptly decreased towards Mn$^{3+}$. These observations suggest that the ferromagnetic phase gradually and most likely inhomogeneously turns into the paramagnetic phase and both phases abruptly become insulating at the critical thickness.<br />Comment: 12 pages, 3 figures

Details

Database :
arXiv
Journal :
Phys. Rev. B 89, 235123 (2014)
Publication Type :
Report
Accession number :
edsarx.1311.0520
Document Type :
Working Paper
Full Text :
https://doi.org/10.1103/PhysRevB.89.235123