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A simple and robust method to study after-pulses in Silicon Photomultipliers
- Publication Year :
- 2014
-
Abstract
- The after-pulsing probability in Silicon Photomulti- pliers and its time constant are obtained measuring the mean number of photo-electrons in a variable time window following a light pulse. The method, experimentally simple and statistically robust due to the use of the Central Limit Theorem, has been applied to an HAMAMATSU MPPC S10362-11-100C.
- Subjects :
- Physics - Instrumentation and Detectors
Subjects
Details
- Database :
- arXiv
- Publication Type :
- Report
- Accession number :
- edsarx.1406.6278
- Document Type :
- Working Paper
- Full Text :
- https://doi.org/10.1088/1748-0221/9/10/T10004