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Direct measurement of the electron energy relaxation dynamics in metallic wires
- Source :
- Phys. Rev. Lett. 116, 236601 (2016)
- Publication Year :
- 2016
-
Abstract
- We present measurements of the dynamical response of thermal noise to an ac excitation in conductors at low temperature. From the frequency dependence of this response function - the noise thermal impedance - in the range 1 kHz-1 GHz we obtain direct determinations of the inelastic relaxation times relevant in metallic wires at low temperature: the electron-phonon scattering time and the diffusion time of electrons along the wires. Combining these results with that of resistivity provides a measurement of heat capacity of samples made of thin film. The simplicity and reliability of this technique makes it very promising for future applications in other systems.<br />Comment: 5 pages, 4 figures
- Subjects :
- Condensed Matter - Mesoscale and Nanoscale Physics
Subjects
Details
- Database :
- arXiv
- Journal :
- Phys. Rev. Lett. 116, 236601 (2016)
- Publication Type :
- Report
- Accession number :
- edsarx.1603.08967
- Document Type :
- Working Paper
- Full Text :
- https://doi.org/10.1103/PhysRevLett.116.236601