Performance of the micro-TPC Reconstruction for GEM Detectors at High Rate

Gas detectors are one of the pillars of the research in fundamental physics. Since many years, a new concept of detectors, the Micro Pattern Gas Detectors, allows to overcome many of the problems of other types of commonly used detectors, as drift chambers and microstrips, reducing the discharge rate and increasing the radiation tolerance. Among these, one of the most commonly used is the Gas Electron Multiplier. Commonly deployed as fast timing detectors and triggers, due to their fast response, high rate capability and high radiation hardness, they can also be used as trackers. The center of gravity readout technique allows to overcome the limit of the digital pads, whose spatial resolution is constrained by the pitch size. The presence of a high external magnetic field can distort the electronic cloud and affect the spatial resolution. The micro-TPC reconstruction method allows to reconstruct the three dimensional particle position as in a traditional Time Projection Chamber, but within a drift gap of a few millimeters. This method brings these detectors into a new perspective for what concerns the spatial resolution in strong magnetic field. In this report, the basis of this new technique will be shown and it will be compared to the traditional center of gravity. The results of a series of test beam performed with 10 x 10 cm2 planar prototypes in magnetic field will also be presented. This is one of the first implementations of this technique for GEM detectors in magnetic field and allows to reach unprecedented performance for gas detectors, up to a limit of 120 micron at 1T, one of the world's best results for MPGDs in strong magnetic field. The micro-TPC reconstruction has been recently tested at very high rates in a test beam at the MAMI facility; preliminary results of the test will be presented.
Comment: Proceedings for "2017 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)" (IEEE17) Conference, 21-28 October 2017, Atlanga, Georgia, USA (prepared for submission to IEEE Conference Record)