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Time-resolved X-ray diffraction study of the structural dynamics in a ferroelectric thin film induced by sub-coercive fields
- Publication Year :
- 2018
-
Abstract
- The electric field-dependence of structural dynamics in a tetragonal ferroelectric lead zirconate titanate thin film is investigated under sub-coercive and above-coercive fields using time-resolved X-ray diffraction. During the application of an external field to the pre-poled thin film capacitor, structural signatures of domain nucleation and growth include broadening of the in-plane peak width of a Bragg reflection concomitant with a decrease of the peak intensity. This disordered domain state is remanent and can be erased with an appropriate voltage pulse sequence.
- Subjects :
- Physics - Applied Physics
Subjects
Details
- Database :
- arXiv
- Publication Type :
- Report
- Accession number :
- edsarx.1812.01740
- Document Type :
- Working Paper
- Full Text :
- https://doi.org/10.1063/1.5084104