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Capacitive imaging using fused amplitude and phase information for improved defect detection

Authors :
Amato, Silvio
Hutchins, David
Yin, Xiaokang
Ricci, Marco
Laureti, Stefano
Source :
NDT & E International 124 (2021) 102547
Publication Year :
2021

Abstract

This paper introduces an improved image processing method usable in capacitive imaging applications. Standard capacitive imaging tends to prefer amplitude-based images over the use of phase due to better signal-to-noise ratios. The new approach exploits the best features of both types of information by combining them to form clearer images, hence improving both defect detection and characterization in non-destructive evaluation. The methodology is demonstrated and optimized using a benchmark sample. Additional experiments on glass fibre composite sample illustrate the advantages of the technique.

Details

Database :
arXiv
Journal :
NDT & E International 124 (2021) 102547
Publication Type :
Report
Accession number :
edsarx.2103.14170
Document Type :
Working Paper
Full Text :
https://doi.org/10.1016/j.ndteint.2021.102547