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Neural network analysis of neutron and X-ray reflectivity data: automated analysis using mlreflect, experimental errors and feature engineering

Authors :
Greco, Alessandro
Starostin, Vladimir
Edel, Evelyn
Munteanu, Valentin
Russegger, Nadine
Dax, Ingrid
Shen, Chen
Bertram, Florian
Hinderhofer, Alexander
Gerlach, Alexander
Schreiber, Frank
Publication Year :
2022

Abstract

This work demonstrates the Python package mlreflect which implements an optimized pipeline for the automized analysis of reflectometry data using machine learning. The package combines several training and data treatment techniques discussed in previous publications. The predictions made by the neural network are accurate and robust enough to serve as good starting parameters for an optional subsequent least mean squares (LMS) fit of the data. It is shown that for a large dataset of 242 reflectivity curves of various thin films on silicon substrates, the pipeline reliably finds an LMS minimum very close to a fit produced by a human researcher with the application of physical knowledge and carefully chosen boundary conditions. Furthermore, the differences between simulated and experimental data and their implications for the training and performance of neural networks are discussed. The experimental test set is used to determine the optimal noise level during training. Furthermore, the extremely fast prediction times of the neural network are leveraged to compensate for systematic errors by sampling slight variations of the data.<br />Comment: pre-print

Details

Database :
arXiv
Publication Type :
Report
Accession number :
edsarx.2202.11609
Document Type :
Working Paper