Cite
Microstructuring YbRh2Si2 for resistance and noise measurements down to ultra-low temperatures
MLA
Steppke, Alexander, et al. Microstructuring YbRh2Si2 for Resistance and Noise Measurements down to Ultra-Low Temperatures. 2023. EBSCOhost, https://doi.org/10.1088/1367-2630/aca8c6.
APA
Steppke, A., Hamann, S., König, M., Mackenzie, A. P., Kliemt, K., Krellner, C., Kopp, M., Lonsky, M., Müller, J., Levitin, L. V., Saunders, J., & Brando, M. (2023). Microstructuring YbRh2Si2 for resistance and noise measurements down to ultra-low temperatures. https://doi.org/10.1088/1367-2630/aca8c6
Chicago
Steppke, Alexander, Sandra Hamann, Markus König, Andrew P. Mackenzie, Kristin Kliemt, Cornelius Krellner, Marvin Kopp, et al. 2023. “Microstructuring YbRh2Si2 for Resistance and Noise Measurements down to Ultra-Low Temperatures.” doi:10.1088/1367-2630/aca8c6.