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Designing topology and fractionalization in narrow gap semiconductor films via electrostatic engineering

Authors :
Tan, Tixuan
Reddy, Aidan P.
Fu, Liang
Devakul, Trithep
Publication Year :
2024

Abstract

We show that topological flat minibands can be engineered in a class of narrow gap semiconductor films using only an external electrostatic superlattice potential. We demonstrate that, for realistic material parameters, these bands are capable of hosting correlated topological phases such as integer and fractional quantum anomalous Hall states and composite Fermi liquid phases at zero magnetic field. Our results provide a path towards the realization of fractionalized topological states in a broad range of materials.

Details

Database :
arXiv
Publication Type :
Report
Accession number :
edsarx.2402.03085
Document Type :
Working Paper