Cite
Characterisation of oxidation techniques on wide bandgap semiconductor surfaces
MLA
Astley, Simon. Characterisation of Oxidation Techniques on Wide Bandgap Semiconductor Surfaces. Jan. 2020. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsble&AN=edsble.834162&authtype=sso&custid=ns315887.
APA
Astley, S. (2020). Characterisation of oxidation techniques on wide bandgap semiconductor surfaces.
Chicago
Astley, Simon. 2020. “Characterisation of Oxidation Techniques on Wide Bandgap Semiconductor Surfaces,” January. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsble&AN=edsble.834162&authtype=sso&custid=ns315887.