Condition Assessment of HV Bushings with Solid Insulation based on the SVM and the FDS Methods

This paper presents the dielectric response of the insulation of bushings as an effect of the simulated long-term aging process. The experiment was conducted under a condition of a high temperature difference between the current circuit and the cover. The dielectric response was measured with the FDS (Frequency Dielectric Spectroscopy) and the SVM (Step Voltage Measurement) methods. The research has shown the correlation between the aging time and some parameters obtained with the FDS and SVM analysis.