A Closed-Form and Stochastic Wall Insertion Loss Model for Dense Small Cell Networks

A novel closed-form and stochastic internal wall insertion loss model (IWIL) in the indoor- indoor channel is proposed in this paper. The IWIL (dimensionless) is modeled as a generalized beta prime distributed random variable on the basis of the Nakagami fading. The probability distribution function (PDF), expectation, and standard deviation of IWIL are derived based on the proposed model. The impacts of the Nakagami-m parameters on the expectation and standard deviation of IWIL are also analyzed. Extensive IWIL measurements at 3.5, 6, and 11 GHz are carried out to validate the proposed model. Both Kolmogorov- Smirnov and Chi-square tests are exploited to determine the goodness of fitting between the modeled and measured data. Results show that the modeled PDF provides a better fit to the measured PDF than that of the Log-normal distribution. The proposed model can be used for the dense small cell networks in the future fifth generation wireless communication.