Back to Search Start Over

Thickness-dependent electron–lattice equilibration in laser-excited thin bismuth films

Thickness-dependent electron–lattice equilibration in laser-excited thin bismuth films

Authors :
K Sokolowski-Tinten
R K Li
A H Reid
S P Weathersby
F Quirin
T Chase
R Coffee
J Corbett
A Fry
N Hartmann
C Hast
R Hettel
M Horn von Hoegen
D Janoschka
J R Lewandowski
M Ligges
F Meyer zu Heringdorf
X Shen
T Vecchione
C Witt
J Wu
H A Dürr
X J Wang
Source :
New Journal of Physics, Vol 17, Iss 11, p 113047 (2015)
Publication Year :
2015
Publisher :
IOP Publishing, 2015.

Abstract

Electron–phonon coupling processes determine electronic transport properties of materials and are responsible for the transfer of electronic excess energy to the lattice. With decreasing device dimensions an understanding of these processes in nanoscale materials is becoming increasingly important. Here we use time-resolved electron diffraction to directly study energy relaxation in thin bismuth films after optical excitation. Precise measurements of the transient Debye–Waller-effect for various film thicknesses and over an extended range of excitation fluences allow to separate different contributions to the incoherent lattice response. While phonon softening in the electronically excited state is responsible for an immediate increase of the r.m.s. atomic displacement within a few hundred fs, ‘ordinary’ electron–phonon coupling leads to subsequent heating of the material on a few ps time-scale. The data reveal distinct changes in the energy transfer dynamics which becomes faster for stronger excitation and smaller film thickness, respectively. The latter effect is attributed to a cross-interfacial coupling of excited electrons to phonons in the substrate.

Details

Language :
English
ISSN :
13672630
Volume :
17
Issue :
11
Database :
Directory of Open Access Journals
Journal :
New Journal of Physics
Publication Type :
Academic Journal
Accession number :
edsdoj.0b110471d09448478ef653fdf40ff992
Document Type :
article
Full Text :
https://doi.org/10.1088/1367-2630/17/11/113047