A Fast Extraction Method of Energy Distribution of Border Traps in AlGaN/GaN MIS-HEMT

MLA

Rui Gao, et al. “A Fast Extraction Method of Energy Distribution of Border Traps in AlGaN/GaN MIS-HEMT.” IEEE Journal of the Electron Devices Society, vol. 8, Jan. 2020, pp. 905–10. EBSCOhost, https://doi.org/10.1109/JEDS.2020.3016022.

APA

Rui Gao, Yijun Shi, Zhiyuan He, Yiqiang Chen, Yunfei En, Yun Huang, Zhigang Ji, Jianfu Zhang, Weidong Zhang, Xuefeng Zheng, Jinfeng Zhang, & Yang Liu. (2020). A Fast Extraction Method of Energy Distribution of Border Traps in AlGaN/GaN MIS-HEMT. IEEE Journal of the Electron Devices Society, 8, 905–910. https://doi.org/10.1109/JEDS.2020.3016022

Chicago

Rui Gao, Yijun Shi, Zhiyuan He, Yiqiang Chen, Yunfei En, Yun Huang, Zhigang Ji, et al. 2020. “A Fast Extraction Method of Energy Distribution of Border Traps in AlGaN/GaN MIS-HEMT.” IEEE Journal of the Electron Devices Society 8 (January): 905–10. doi:10.1109/JEDS.2020.3016022.