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Directed Model Checking for Fast Abstract Reachability Analysis

Authors :
Nakwon Lee
Yunho Kim
Moonzoo Kim
Duksan Ryu
Jongmoon Baik
Source :
IEEE Access, Vol 9, Pp 158738-158750 (2021)
Publication Year :
2021
Publisher :
IEEE, 2021.

Abstract

We propose a novel technique (TOUR) to improve both bug detection ability and verification speed of ARMC by detecting a target path quickly. The key idea of TOUR is an error location directed search that utilizes the distance to an error location and function call context at runtime. TOUR applies four different distance metrics and a distance metric selection heuristic using static features of a target program. We have extensively evaluated TOUR on 3,042 real-world C programs in a software verification competition benchmark. The experiment results show that TOUR, due to its error location directed search, finds bugs in 20% more programs in 11% less model checking time than the state-of-the-art ARMC technique (i.e., block-abstraction memoization) for 354 buggy programs. Also, TOUR verifies 15% more programs within 15% less model checking time than the block-abstraction memoization for 652 complex clean programs.

Details

Language :
English
ISSN :
21693536
Volume :
9
Database :
Directory of Open Access Journals
Journal :
IEEE Access
Publication Type :
Academic Journal
Accession number :
edsdoj.2592a4bb4fdc467683a44fc281fdf5db
Document Type :
article
Full Text :
https://doi.org/10.1109/ACCESS.2021.3130569