Content-Based Image Retrieval for Semiconductor Process Characterization

MLA

Kenneth W. Tobin, et al. “Content-Based Image Retrieval for Semiconductor Process Characterization.” EURASIP Journal on Advances in Signal Processing, vol. 2002, no. 7, July 2002, pp. 704–13. EBSCOhost, https://doi.org/10.1155/S1110865702203017.

APA

Kenneth W. Tobin, Thomas P. Karnowski, Lloyd F. Arrowood, Regina K. Ferrell, Fred Lakhani, & James S. Goddard. (2002). Content-Based Image Retrieval for Semiconductor Process Characterization. EURASIP Journal on Advances in Signal Processing, 2002(7), 704–713. https://doi.org/10.1155/S1110865702203017

Chicago

Kenneth W. Tobin, Thomas P. Karnowski, Lloyd F. Arrowood, Regina K. Ferrell, Fred Lakhani, and James S. Goddard. 2002. “Content-Based Image Retrieval for Semiconductor Process Characterization.” EURASIP Journal on Advances in Signal Processing 2002 (7): 704–13. doi:10.1155/S1110865702203017.