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Deep learning methods for enhanced stress and pest management in market garden crops: A comprehensive analysis

Authors :
Mireille Gloria Founmilayo Odounfa
Charlemagne D.S.J. Gbemavo
Souand Peace Gloria Tahi
Romain L. Glèlè Kakaï
Source :
Smart Agricultural Technology, Vol 9, Iss , Pp 100521- (2024)
Publication Year :
2024
Publisher :
Elsevier, 2024.

Abstract

Various deep learning methods are employed to detect stress and diseases in market garden crops, as well as to assess their severity. This study aims to comprehensively analyze these techniques and identify potential research avenues. The diversity of deep learning techniques was explored through a literature review based on the PRISMA guidelines. Research equations were defined, resulting in a sample of 1,422 publications, of which 72 were deemed usable and considered in the final analysis. For classification tasks, hybrid CNN models were the most widely used (19.2%). Commonly utilized models included VGG16 (10%), InceptionV3 (6.1%), DCNN (5%), and YoloV5 (5%). In object detection tasks, Fast R-CNN was used six times, followed by YoloV5 (three occurrences) and YoloV3 (two occurrences). In segmentation tasks, Mask R-CNN accounted for 28.67% of the models, while DeepLabV3+ accounted for 24.98%. Assessing disease severity in market garden crops is complex due to the unique criteria for each plant disease and the presence of multiple diseases across different crop types. To address this complexity, establishing a standardized method is crucial. Further research is essential to enhance the application of deep learning techniques in the study of market garden crops. This includes gathering extensive datasets that encompass various scenarios of crop diseases and considering the impact of climate variations on stress manifestation.

Details

Language :
English
ISSN :
27723755
Volume :
9
Issue :
100521-
Database :
Directory of Open Access Journals
Journal :
Smart Agricultural Technology
Publication Type :
Academic Journal
Accession number :
edsdoj.2aa35d0086eb45b8b5463fdd8886d180
Document Type :
article
Full Text :
https://doi.org/10.1016/j.atech.2024.100521