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Micromechanical behaviors related to confined deformation in pure titanium

Authors :
Li Runguang
Wang Youkang
Liu Xiaojing
Li Shilei
Tan Qing
Liu Wenjun
Fang Xing
Wang Yan-Dong
Source :
MATEC Web of Conferences, Vol 321, p 12018 (2020)
Publication Year :
2020
Publisher :
EDP Sciences, 2020.

Abstract

Confined deformation, e.g. mechanical twinning, shear banding, and Lüders banding, etc. was extensively observed in metals and alloys with low stacking-fault energies, especially under complex loadings, governing the mechanical properties. It is often accompanied with gradient microstructures to accommodate the stress concentrations. Understanding the micromechanical behaviors of structural materials having confined deformation is important for evaluating the structural stabilities of engineering components. Synchrotron-based techniques provide powerful tools for multiscale microstructural characterization owing to their good resolution in real/reciprocal space, fast data collection/processing and flexible application scenarios. In this paper, the synchrotron-based high-energy X-ray diffraction (HE-XRD) and microdiffraction (μXRD) techniques in combination with traditional characterization methods are used to reveal the deformational gradient structures/stresses under different loading modes in multiscale. The structure/stress gradients induced by laser shot peening treatment and the deformation twins generated during uniaxial tensile loading in pure titanium were systematically studied by HE-XRD and μXRD, in order to elucidate the accommodating role of the deformational structures subjected to various confined scenarios. The new finding regarding the micromechanical behaviors related to confined deformation contributes to the in-depth understanding of related complex deformation behaviors.

Details

Language :
English, French
ISSN :
2261236X
Volume :
321
Database :
Directory of Open Access Journals
Journal :
MATEC Web of Conferences
Publication Type :
Academic Journal
Accession number :
edsdoj.2d0a6a1c75e47efaedff6fe6d53da1e
Document Type :
article
Full Text :
https://doi.org/10.1051/matecconf/202032112018