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Fully Integrated Silicon Photonic Erbium-Doped Nanodiode for Few Photon Emission at Telecom Wavelengths

Authors :
Giulio Tavani
Chiara Barri
Erfan Mafakheri
Giorgia Franzò
Michele Celebrano
Michele Castriotta
Matteo Di Giancamillo
Giorgio Ferrari
Francesco Picciariello
Giulio Foletto
Costantino Agnesi
Giuseppe Vallone
Paolo Villoresi
Vito Sorianello
Davide Rotta
Marco Finazzi
Monica Bollani
Enrico Prati
Source :
Materials, Vol 16, Iss 6, p 2344 (2023)
Publication Year :
2023
Publisher :
MDPI AG, 2023.

Abstract

Recent advancements in quantum key distribution (QKD) protocols opened the chance to exploit nonlaser sources for their implementation. A possible solution might consist in erbium-doped light emitting diodes (LEDs), which are able to produce photons in the third communication window, with a wavelength around 1550 nm. Here, we present silicon LEDs based on the electroluminescence of Er:O complexes in Si. Such sources are fabricated with a fully-compatible CMOS process on a 220 nm-thick silicon-on-insulator (SOI) wafer, the common standard in silicon photonics. The implantation depth is tuned to match the center of the silicon layer. The erbium and oxygen co-doping ratio is tuned to optimize the electroluminescence signal. We fabricate a batch of Er:O diodes with surface areas ranging from 1 µm × 1 µm to 50 µm × 50 µm emitting 1550 nm photons at room temperature. We demonstrate emission rates around 5 × 106 photons/s for a 1 µm × 1 µm device at room temperature using superconducting nanowire detectors cooled at 0.8 K. The demonstration of Er:O diodes integrated in the 220 nm SOI platform paves the way towards the creation of integrated silicon photon sources suitable for arbitrary-statistic-tolerant QKD protocols.

Details

Language :
English
ISSN :
19961944
Volume :
16
Issue :
6
Database :
Directory of Open Access Journals
Journal :
Materials
Publication Type :
Academic Journal
Accession number :
edsdoj.3af94e4a6806424684c633ac974622fa
Document Type :
article
Full Text :
https://doi.org/10.3390/ma16062344