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New Features in Crystal Orientation and Phase Mapping for Transmission Electron Microscopy

Authors :
Edgar F. Rauch
Patrick Harrison
Xuyang Zhou
Michael Herbig
Wolfgang Ludwig
Muriel Véron
Source :
Symmetry, Vol 13, Iss 9, p 1675 (2021)
Publication Year :
2021
Publisher :
MDPI AG, 2021.

Abstract

ACOM/TEM is an automated electron diffraction pattern indexing tool that enables the structure, phase and crystallographic orientation of materials to be routinely determined. The software package, which is part of ACOM/TEM, has substantially evolved over the last fifteen years and has pioneered numerous additional functions with the constant objective of improving its capabilities to make the tremendous amount of information contained in the diffraction patterns easily available to the user. Initially devoted to the analysis of local crystallographic texture, and as an alternative to both X-ray pole figure measurement and EBSD accessories for scanning electron microscopes, it has rapidly proven itself effective to distinguish multiple different phases contained within a given sample, including amorphous phases. Different strategies were developed to bypass the inherent limitations of transmission electron diffraction patterns, such as 180° ambiguities or the complexity of patterns produced from overlapping grains. Post processing algorithms have also been developed to improve the angular resolution and to increase the computing rate. The present paper aims to review some of these facilities. On-going works on 3D reconstruction are also introduced.

Details

Language :
English
ISSN :
20738994
Volume :
13
Issue :
9
Database :
Directory of Open Access Journals
Journal :
Symmetry
Publication Type :
Academic Journal
Accession number :
edsdoj.49f92923ad74313985f5918a106faf7
Document Type :
article
Full Text :
https://doi.org/10.3390/sym13091675