USE OF INCOHERENT SCATTERING FOR MATRIX EFFECTS CORRECTION IN X-RAY FLUORESCENCE MEASUREMENTS OF Ti, Mn, Fe AND U CONCENTRATIONS IN URANIUM ORES

The work presents the results of method development for matrix effects correction in X-ray fluorescence measurements of Ti, Mn, Fe and U concentrations in the silicate-type uranium ore samples using wavelength dispersive XRF spectrometer S 8 Tiger (Bruker AXS GmbH, Germany). Comparison of the results obtained using standard software package Spectra Plus of the spectrometer and normalized to intensity of characteristic line of primary radiation, incoherently scattered by sample, was carried out. It is shown that for the investigated elements during X-ray fluorescent measurements of their concentrations, in addition to intensity normalization, it is necessary to use additional analytical correction. The use of this method to calculate the corrected concentrations of TiO2, MnO, Fe2O3 and U3O8 allows to decrease the relative error of measurements up to < 5 % within the range of concentrations 0.1…4 mas. % and up to ≤ 7.5 % within the range of concentrations 0.04…0.06 mas. %.