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Effect of Annealing Temperature on Structural, Morphological, Optical and Electrical Properties of Spray Deposited V2O5 Thin Films
- Source :
- Medžiagotyra, Vol 25, Iss 1, Pp 3-6 (2019)
- Publication Year :
- 2019
- Publisher :
- Kaunas University of Technology, 2019.
-
Abstract
- Nanostructured vanadium pentoxide (V2O5) thin films have been deposited by a simple and cost-effective spray pyrolysis technique (SPT) at substrate temperature 300 °C and post annealed at atmospheric conditions in the temperature range from 300 °C to 500 °C at a constant rate of heating. The influence of post annealing heat treatment on the crystallization of V2O5 has been investigated. Films were characterized structurally by X-ray diffraction, morphologically by Scanning electron microscopy, optically using UV-Vis spectrophotometer, electrical characterization using Hall probe and Raman spectroscopy has been carried out for phase confirmation. X-ray diffraction analysis (XRD) revealed that, as deposited films were orthorhombic structures with a preferential orientation along (0 0 1) direction. Moreover, it was observed that crystallite size increases from 22 nm to 56 nm with increase in annealing temperature. Optical properties of these samples were studied in the wavelength range 300 – 1000 nm. Raman spectrum confirms the layered structure of V2O5 thin films. Hall Effect measurements indicate that the change in carrier concentration with increase in annealing temperature.
Details
- Language :
- English
- ISSN :
- 13921320 and 20297289
- Volume :
- 25
- Issue :
- 1
- Database :
- Directory of Open Access Journals
- Journal :
- Medžiagotyra
- Publication Type :
- Academic Journal
- Accession number :
- edsdoj.610a453c9d044a14acaf26c3e70b7a4c
- Document Type :
- article
- Full Text :
- https://doi.org/10.5755/j01.ms.25.1.18492