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Comparing single-shot damage thresholds of boron carbide and silicon at the European XFEL

Authors :
Marziyeh Tavakkoly
Jaromir Chalupsky
Vera Hajkova
Wolfgang Hillert
Simon Jelinek
Libor Juha
Mikako Makita
Tommaso Mazza
Michael Meyer
Jacobo Montano
Harald Sinn
Vojtech Vozda
Maurizio Vannoni
Source :
Journal of Synchrotron Radiation, Vol 31, Iss 5, Pp 1067-1070 (2024)
Publication Year :
2024
Publisher :
International Union of Crystallography, 2024.

Abstract

Xray free-electron lasers (XFELs) enable experiments that would have been impractical or impossible at conventional X-ray laser facilities. Indeed, more XFEL facilities are being built and planned, with their aim to deliver larger pulse energies and higher peak brilliance. While seeking to increase the pulse power, it is quintessential to consider the maximum pulse fluence that a grazing-incidence FEL mirror can withstand. To address this issue, several studies were conducted on grazing-incidence damage by soft X-ray FEL pulses at the European XFEL facility. Boron carbide (B4C) coatings on polished silicon substrate were investigated using 1 keV photon energy, similar to the X-ray mirrors currently installed at the soft X-ray beamlines (SASE3). The purpose of this study is to compare the damage threshold of B4C and Si to determine the advantages, tolerance and limits of using B4C coatings.

Details

Language :
English
ISSN :
16005775
Volume :
31
Issue :
5
Database :
Directory of Open Access Journals
Journal :
Journal of Synchrotron Radiation
Publication Type :
Academic Journal
Accession number :
edsdoj.6bad286d34f34c92a4fe1eba765553c6
Document Type :
article
Full Text :
https://doi.org/10.1107/S1600577524007318