Polarization-dependent losses in porous silicon ridge waveguides

Porous silicon is a material used in integrated optics with few studies on its structuration impact on the polarization in the near infra-red spectral range. In this letter, we report experimental results from optical characterizations around the wavelength of 1550 nm and for different input polarization in porous silicon ridge waveguides. We highlight filtering of light polarization that attenuates transverse electric mode in passive porous silicon ridge waveguides.