Induced variability for yield and its attributing traits in cluster bean [Cyamopsis tetragonoloba (L. ) Taub] through gamma irradiation

Gamma ray is an effective mutagen which creates useful variability for crop like cluster bean where the natural variation is very meagre and creation of variability by conventional methods is cumbersome. In the present study, cluster bean cv. Pusa Navbahar was treated with different level of gamma rays from 50 Gy to 600 Gy with 50Gy interval and obtained M2 population was subjected to variability estimation for yield and its attributing traits in augmented block design. The variance between the control and the mutants was found to be significant for plant height, number of pods per cluster, number of pods per plant, pod length, pod width, pulp to seed ratio. For these traits, PCV ranged from 14.28 per cent (pod width) to 31.99 per cent (pulp to seed ratio) whereas, GCV ranged from 10.10 per cent (pod width) to 24.16 per cent (pulp to seed ratio). The heritability in broad sense ranged from 50 per cent (pod width) to 79.99 per cent (Plant height). Genetic advance expressed as percentage over mean ranged from 2.06 per cent (pod width) to 222.44 per cent (plant height). The traits like plant height, pod length, pod width, pulp to seed ratio showed sufficient variability due to induced mutation. All these traits showed medium to high heritability and high genetic advance hence selection for these traits will be effective.