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Current crowding mediated large contact noise in graphene field-effect transistors
- Source :
- Nature Communications, Vol 7, Iss 1, Pp 1-8 (2016)
- Publication Year :
- 2016
- Publisher :
- Nature Portfolio, 2016.
-
Abstract
- The performance of graphene field effect transistors is adversely affected by fluctuations in the electrical resistance at the graphene/metal interface. Here, the authors unveil the microscopic origin of such contact noise, highlighting the role of current crowding.
- Subjects :
- Science
Subjects
Details
- Language :
- English
- ISSN :
- 20411723
- Volume :
- 7
- Issue :
- 1
- Database :
- Directory of Open Access Journals
- Journal :
- Nature Communications
- Publication Type :
- Academic Journal
- Accession number :
- edsdoj.95d32f108b3849d1910209b6e411b939
- Document Type :
- article
- Full Text :
- https://doi.org/10.1038/ncomms13703