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Crystal plasticity modeling of deformation behavior of Al–Al2Cu eutectics based on high-fidelity representative microstructures

Authors :
Meirong Jiang
Yiming Chen
Zhongsheng Yang
Xiaobing Hu
Lei Zhang
Junjie Li
Zhijun Wang
Shuangming Li
Jincheng Wang
Source :
Journal of Materials Research and Technology, Vol 29, Iss , Pp 5259-5270 (2024)
Publication Year :
2024
Publisher :
Elsevier, 2024.

Abstract

A comprehensive understanding of material deformation behavior holds importance in enhancing the properties of materials, which can be achieved through modeling the relationship between microstructure and deformation behavior by an appropriate crystal plasticity (CP) model. However, before simulations, obtaining a high-fidelity representative microstructure (RM) to simultaneously meet the efficiency and accuracy requirements of the CP model is still a challenge. Thus, taking the Al–Al2Cu eutectics as an example, we successfully obtained a high-fidelity RM with two-point statistics and some fashionable image processing techniques. Then a high-resolution RMCP model was developed and the deformation behavior of Al–Al2Cu eutectics at room temperatures was uncovered. Due to multiple activated slip systems on {111} inducing obvious cross-slip behavior, severe and heterogenous plastic deformation occurs in α-Al. And dislocations originate from the microstructure defects. In θ-Al2Cu, all possible slip systems are not activated, resulting in no plastic deformation. The predictions of the RMCP model are verified to be reliable by comparing with the results of in-situ tensile tests. Our proposed RMCP method is not only applicable to the two-phase eutectic systems, but also suitable for various multiphase and polycrystalline systems.

Details

Language :
English
ISSN :
22387854
Volume :
29
Issue :
5259-5270
Database :
Directory of Open Access Journals
Journal :
Journal of Materials Research and Technology
Publication Type :
Academic Journal
Accession number :
edsdoj.b3cb21f1527442f291f6fe7f2791dea4
Document Type :
article
Full Text :
https://doi.org/10.1016/j.jmrt.2024.02.204