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Correlation between microhardness and microstructure of low-temperature Sn-xBi-M(Ag, Sb) solders

Authors :
J. Ren
F.F. Huang
M.L. Huang
Source :
Journal of Materials Research and Technology, Vol 31, Iss , Pp 165-169 (2024)
Publication Year :
2024
Publisher :
Elsevier, 2024.

Abstract

The correlation between Vickers microhardness and microstructure of low-temperature Sn-xBi-M(Ag, Sb) solders was investigated. The β-Sn grains were refined with increasing Bi content, as well as the additions of Ag and Sb. Fine β-Sn grains in general should strengthen the mechanical properties of solders, however, the Vickers microhardness of Sn-xBi-M(Ag, Sb) solders decreased with increasing Bi content (i.e., fine β-Sn grains). It was shown that the microhardness of Sn-xBi-M(Ag, Sb) solders depended on the amount of Bi/β-Sn interfaces rather than the fine-grain strengthening effect. The smaller the amount of Bi/β-Sn interfaces was, the higher the Vickers microhardness of Sn-xBi-M(Ag, Sb) solders.

Details

Language :
English
ISSN :
22387854
Volume :
31
Issue :
165-169
Database :
Directory of Open Access Journals
Journal :
Journal of Materials Research and Technology
Publication Type :
Academic Journal
Accession number :
edsdoj.f4079c145dcd4220ac79a2f26dec0b56
Document Type :
article
Full Text :
https://doi.org/10.1016/j.jmrt.2024.06.063