X-ray photoelectron spectroscopy study of high-k CeO2/La2O3 stacked dielectrics

MLA

Jieqiong Zhang, et al. “X-Ray Photoelectron Spectroscopy Study of High-k CeO2/La2O3 Stacked Dielectrics.” AIP Advances, vol. 4, no. 11, Nov. 2014. EBSCOhost, https://doi.org/10.1063/1.4902017.

APA

Jieqiong Zhang, Hei Wong, Danqun Yu, Kuniyuki Kakushima, & Hiroshi Iwai. (2014). X-ray photoelectron spectroscopy study of high-k CeO2/La2O3 stacked dielectrics. AIP Advances, 4(11). https://doi.org/10.1063/1.4902017

Chicago

Jieqiong Zhang, Hei Wong, Danqun Yu, Kuniyuki Kakushima, and Hiroshi Iwai. 2014. “X-Ray Photoelectron Spectroscopy Study of High-k CeO2/La2O3 Stacked Dielectrics.” AIP Advances 4 (11). doi:10.1063/1.4902017.