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Reliability of Microtechnology : Interconnects, Devices and Systems

Authors :
Johan Liu
Olli Salmela
Jussi Sarkka
James E. Morris
Per-Erik Tegehall
Cristina Andersson
Johan Liu
Olli Salmela
Jussi Sarkka
James E. Morris
Per-Erik Tegehall
Cristina Andersson
Publication Year :
2011

Abstract

Reliability of Microtechnology discusses the reliability of microtechnology products from the bottom up, beginning with devices and extending to systems. The book's focus includes but is not limited to reliability issues of interconnects, the methodology of reliability concepts and general failure mechanisms. Specific failure modes in solder and conductive adhesives are discussed at great length. Coverage of accelerated testing, component and system level reliability, and reliability design for manufacturability are also described in detail.The book also includes exercises and detailed solutions at the end of each chapter.

Details

Language :
English
ISBNs :
9781441957597, 9781489982117, and 9781441957603
Database :
eBook Index
Journal :
Reliability of Microtechnology : Interconnects, Devices and Systems
Publication Type :
eBook
Accession number :
372265