Behavioral Models of I/O Ports From Measured Transient Waveforms

Subjects

Subjects :

I/O device
Institute of Electrical and Electronics Engineers -- Reports
I/O devices -- Research
Waveforms -- Measurement

Details

Language :

English

ISSN :

00189456

Volume :

51

Issue :

6

Database :

Gale General OneFile

Journal :

IEEE Transactions on Instrumentation & Measurement

Publication Type :

Academic Journal

Accession number :

edsgcl.101872394