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CrossCheck testability reaches commercial gate array family

Authors :
Tuck, Barbara
Source :
Computer Design. March 1, 1991, Vol. 30 Issue 5, p48, 3 p.
Publication Year :
1991

Abstract

CrossCheck testability reaches commercial gate array family It took longer than expected, but, more than three years after CrossCheck Technology (San Jose, CA) was founded, the first commercial silicon implementation […]

Details

Language :
English
ISSN :
00104566
Volume :
30
Issue :
5
Database :
Gale General OneFile
Journal :
Computer Design
Publication Type :
Academic Journal
Accession number :
edsgcl.10451397