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Next-generation valve design for copper CMP: addressing agglomeration, shear forces, contamination and waste: the movement from aluminum to copper seeding and the attending challenges of copper CMP have placed tremendous responsibility on slurry delivery systems. New designs, new thinking begin to emerge
- Source :
- CleanRooms. August, 2003, Vol. 17 Issue 8, p20, 3 p.
- Publication Year :
- 2003
-
Abstract
- Copper physical vapor deposition (PVD) seeding and subsequent fill by electroplating has become the process of choice for microchip fabrication. As line widths shrink, aluminum becomes insufficiently effective as a [...]
Details
- Language :
- English
- ISSN :
- 10438017
- Volume :
- 17
- Issue :
- 8
- Database :
- Gale General OneFile
- Journal :
- CleanRooms
- Publication Type :
- Periodical
- Accession number :
- edsgcl.107202105