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A cost-effective wafer-level reliability test system for integrated circuit makers
- Source :
- IEEE Transactions on Instrumentation & Measurement. Oct, 2003, Vol. 52 Issue 5, p1458, 10 p.
- Publication Year :
- 2003
- Subjects :
- Semiconductor device
Standard IC
Integrated circuit fabrication
Semiconductor chips -- Design and construction
Semiconductor chips -- Research
Semiconductor chips -- Testing
Integrated circuits -- Design and construction
Integrated circuits -- Research
Integrated circuits -- Testing
Integrated circuit fabrication -- Testing
Integrated circuit fabrication -- Research
Self-test capability (Electronics) -- Research
Automatic testing equipment -- Research
Subjects
Details
- Language :
- English
- ISSN :
- 00189456
- Volume :
- 52
- Issue :
- 5
- Database :
- Gale General OneFile
- Journal :
- IEEE Transactions on Instrumentation & Measurement
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.110790311