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High-voltage constraints for vacuum packaged microstructures

Authors :
Wilson, Chester G.
Gianchandani, Yogesh B.
Wendt, Amy E.
Source :
Journal of Microelectromechanical Systems. Dec, 2003, Vol. 12 Issue 6, p835, 5 p.
Publication Year :
2003

Abstract

In order to understand the details of high-field breakdown in microstructures that are vacuum packaged, a series of experiments are used to determine characteristics of microdischarges. The results support a reinterpretation of conventional assumptions based upon large scale discharges. When planar microelectrodes are used, Paschen's curve is not applicable in the traditional sense: the breakdown voltage is relatively insensitive to pressure in the 1-20 torr range, and remains at ~400 V for air ambient. However, the spatial distribution of discharge current does vary with the pressure and the power. Large voltage gradients are supported in the glow region which is confined to a few millimeters directly above the cathode, and within a few hundred microns of its lateral edge. Their magnitudes range from 100 000-500 000 V/m for operating pressures ranging from 1.2-6 torr. Based on these results, guidelines are provided for the design of high-voltage microsystems. [916] Index Terms--Electric breakdown, electrostatic devices, microdischarge, microplasma.

Details

Language :
English
ISSN :
10577157
Volume :
12
Issue :
6
Database :
Gale General OneFile
Journal :
Journal of Microelectromechanical Systems
Publication Type :
Academic Journal
Accession number :
edsgcl.112798759