Ultra-fast optical spectrum analyzer for DWDM applications

Subjects

Subjects :

Interferometry -- Analysis
Interferometry -- Structure
Semiconductor lasers -- Analysis

Details

Language :

English

ISSN :

00189456

Volume :

53

Issue :

1

Database :

Gale General OneFile

Journal :

IEEE Transactions on Instrumentation & Measurement

Publication Type :

Academic Journal

Accession number :

edsgcl.121604662