Configurable two-dimensional linear feedback shifter registers for parallel and serial built-in self-test

Subjects

Subjects :

Standard IC
System on a chip
Embedded system
Semiconductor chips -- Analysis
Integrated circuits -- Analysis
Embedded systems -- Analysis

Details

Language :

English

ISSN :

00189456

Volume :

53

Issue :

4

Database :

Gale General OneFile

Journal :

IEEE Transactions on Instrumentation & Measurement

Publication Type :

Academic Journal

Accession number :

edsgcl.122609765