Energy dispersive X-ray reflectometry of the NO2 interaction with ruthenium phthalocyanine films

The experiment was done where the X-ray reflectometry technique in its energy dispersive variant (EDXR) is used to study the morphological characteristics of dimeric ruthenium phthalocyanine thin films. The study gives information on the gas diffusion process through the film and the mechanisms of interaction between the film and gas molecules.