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Atomic force microscopy-induced electric field in ferroelectric thin films
- Source :
- Journal of Applied Physics. Sept 15, 2003, Vol. 94 Issue 6, 4053-4059
- Publication Year :
- 2003
-
Abstract
- An explicit expression for the atomic force microscopy-induced electric field in a ferroelectric thin film is reported. Based on this approach, the depolarization field and the energy created by the polarization charges for different substrates can be studied.
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 94
- Issue :
- 6
- Database :
- Gale General OneFile
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.123182376