Nanoscale imaging of the electronic conductivity of the native oxide film on titanium using conducting atomic force microscopy

Authors :: Boxley, Chett J.
White, Henry S.
Gardner, Catherine E.
Macpherson, Julie V.
Adam, Sorin
Source :: Journal of Physical Chemistry B. Sept 11, 2003, Vol. 107 Issue 36, p9677, 5 p.
Publication Year :: 2003
Abstract: The heterogeneous electronic conductivity of the native oxide film on polycrystalline Ti electrodes is studied by using the atomic force microscopy. It is revealed that there are large spatial variations in the oxide film conductivity on topographically featureless regions of grain faces.

Subjects :: Atomic force microscopy -- Usage
Atomic force microscopy -- Observations
Titanium -- Structure
Titanium -- Atomic properties
Chemistry, Physical and theoretical -- Research
Chemicals, plastics and rubber industries

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