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Three-dimensional investigations of electrical barriers using electron beam induced current measurements

Authors :
Gaevski, Mikhail
Elfwing, Mattias
Olsson, Eva
Kvist, Anders
Zhang, Y
Zhu, D.
Source :
Journal of Applied Physics. March 1, 2002, Vol. 91 Issue 5, p2713, 12 p.
Publication Year :
2002

Abstract

Three-dimensional (3D)-investigations of electrically active interfaces in ZnO varistor materials are performed using electron beam induced current (EBIC) contrast in the scanning electron microscope in combination with the focused ion beam workstation (FIB). Small differences in deep donor concentrations were responsible for the barriers asymmetry under zero applied voltage.

Details

Language :
English
ISSN :
00218979
Volume :
91
Issue :
5
Database :
Gale General OneFile
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
edsgcl.123606674