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Density and concentration fluctuations in F-doped Sio2 glass

Authors :
Watanabe, T.
Saito, K.
Ikushima, A.J.
Source :
Journal of Applied Physics. March 1, 2004, Vol. 95 Issue 5, p2432, 4 p.
Publication Year :
2004

Abstract

The fictive temperature (T(sub f) ) and fluorine concentration dependence of structure fluctuation in SiO2 glass were investigated by small-angle x-ray scattering measurement, in this study. It was found that density fluctuation solely contributes to the T(sub f) dependence of structure fluctuation.

Subjects

Subjects :
Fluctuations (Physics) -- Research
Oxygen -- Structure
Oxygen -- Research
Oxygen -- Optical properties
Silicon compounds -- Structure
Silicon compounds -- Research
Silicon compounds -- Optical properties
Fluorine -- Structure
Fluorine -- Research
Fluorine -- Optical properties
Physics

Details

Language :
English
ISSN :
00218979
Volume :
95
Issue :
5
Database :
Gale General OneFile
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
edsgcl.123693609

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