Back to Search
Start Over
Density and concentration fluctuations in F-doped Sio2 glass
- Source :
- Journal of Applied Physics. March 1, 2004, Vol. 95 Issue 5, p2432, 4 p.
- Publication Year :
- 2004
-
Abstract
- The fictive temperature (T(sub f) ) and fluorine concentration dependence of structure fluctuation in SiO2 glass were investigated by small-angle x-ray scattering measurement, in this study. It was found that density fluctuation solely contributes to the T(sub f) dependence of structure fluctuation.
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 95
- Issue :
- 5
- Database :
- Gale General OneFile
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.123693609