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Characterization of heterojunction diodes with hydride vapor phase epitaxy grown AlGaN on 4H-SiC
- Source :
- Journal of Applied Physics. Feb 15, 2002, Vol. 91 Issue 4, 2372-2379
- Publication Year :
- 2002
-
Abstract
- The electrical properties and the characteristics of GaN and AlGaN heterojunction diodes are investigated with varying Al composition. The tunnel assisted recombination model agreed well with both current-voltage and capacitance-voltage measurements for this diode.
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 91
- Issue :
- 4
- Database :
- Gale General OneFile
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.123698698