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Paramagnetic defects in ultrafine silicon particles
- Source :
- Journal of Applied Physics. Jan 15, 2002, Vol. 91 Issue 2, p815, 4 p.
- Publication Year :
- 2002
-
Abstract
- Two types of paramagnetic defects in the surface oxide layer of ultrafine Si particles, temporarily named an EX(sub L) center and an EX(sub H) center, are investigated by Electron spin resonance (ESR). The relationship between ESR signals and infrared spectra is studied.
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 91
- Issue :
- 2
- Database :
- Gale General OneFile
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.123701552