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Fictive temperature dependence of density fluctuation in SiO2 glass
- Source :
- Journal of Applied Physics. Oct 15, 2003, Vol. 94 Issue 8, 4824-4827
- Publication Year :
- 2003
-
Abstract
- Fictive temperature dependence of density fluctuation in SiO2 glass is investigated by the small-angle x-ray scattering measurement. The study shows that the density fluctuation in SiO2 glass is less than 3.6%, hence, the density deviation or size of the inhomogeneous structure is small.
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 94
- Issue :
- 8
- Database :
- Gale General OneFile
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.124244664