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Influence of boundary roughness on the magnetization reversal in submicron sized magnetic tunnel junctions
- Source :
- Journal of Applied Physics. March 1, 2003, Vol. 93 Issue 5, 2676-2680
- Publication Year :
- 2003
-
Abstract
- Structural imperfections on the nanometer scale act as imperfect corners and rough electrode boundaries cause junction specific magnetic switching behavior. Micromagnetic numerical simulations with the real atomic force microscopy (AFM) shape show that these individual details significantly influence the nucleation, location, and mobility of domain walls.
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 93
- Issue :
- 5
- Database :
- Gale General OneFile
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.124287634