Back to Search Start Over

Influence of boundary roughness on the magnetization reversal in submicron sized magnetic tunnel junctions

Authors :
Meyners, D.
Bruckl, H.
Reiss, G.
Source :
Journal of Applied Physics. March 1, 2003, Vol. 93 Issue 5, 2676-2680
Publication Year :
2003

Abstract

Structural imperfections on the nanometer scale act as imperfect corners and rough electrode boundaries cause junction specific magnetic switching behavior. Micromagnetic numerical simulations with the real atomic force microscopy (AFM) shape show that these individual details significantly influence the nucleation, location, and mobility of domain walls.

Details

Language :
English
ISSN :
00218979
Volume :
93
Issue :
5
Database :
Gale General OneFile
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
edsgcl.124287634