Back to Search
Start Over
Identification of different phases in barriers of interface-engineered ramp-edge Josephson junctions: Formation mechanisms and influences on electrical properties
- Source :
- Journal of Applied Physics. Oct 15, 2002, Vol. 92 Issue 8, p4571, 7 p.
- Publication Year :
- 2002
-
Abstract
- Interface-engineered ramp-edge Josephson junctions with different critical current values and different electrode materials are investigated by transmission electron microscopy. La doping seems to suppress the formation of Y(sub 2)O(sub 3) and reduce the lattice mismatch between the barrier and the electrodes.
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 92
- Issue :
- 8
- Database :
- Gale General OneFile
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.125136448