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Sequential diagnosis of processor array systems

Authors :
Zhao, Jun
Meyer, Fred J.
Park, Nohpill
Lombardi, Fabrizio
Source :
IEEE Transactions on Reliability. Dec, 2004, Vol. 53 Issue 4, p487, 12 p.
Publication Year :
2004

Abstract

The diagnosis of processor array systems formed as two-dimensional arrays, with boundaries, and either four or eight neighbors for each interior processor are examined. Findings show that for eight-way array systems with N processors, an ideal algorithm has diagnosability 3N(super 2/3) - 2N(super 1/2) plus lower-order terms.

Subjects

Subjects :
Array processors -- Research
Sequential analysis -- Methods
Processor architecture -- Research
Processor architecture
Business
Electronics
Electronics and electrical industries

Details

Language :
English
ISSN :
00189529
Volume :
53
Issue :
4
Database :
Gale General OneFile
Journal :
IEEE Transactions on Reliability
Publication Type :
Academic Journal
Accession number :
edsgcl.126540523

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